Conditional high-impedance (HiZ) nets errors are among the most serious risks in an IC project because of their capacity to elude Silicon qualification phases and escape into mass-production. They may create a wide range of issues throughout the Validation, Qualification and Ramp-up of an IC design.
This paper reviews the different types of circuit topologies that can lead to potentially harmful HiZ and reliable techniques to detect those errors at SoC scale with a very reduced human resource investment.
Aniah’s AI-driven Electrical Verification Platform Adopted by Elmos
Aniah’s AI-driven Electrical Verification Platform Adopted by Elmos, a leading Automotive Semiconductor Company to Accelerate Next-Generation Automotive Chip Design (Grenoble, France) - June 2026 - Aniah, a next-generation provider of advanced electrical...


