Conditional high-impedance (HiZ) nets errors are among the most serious risks in an IC project because of their capacity to elude Silicon qualification phases and escape into mass-production. They may create a wide range of issues throughout the Validation, Qualification and Ramp-up of an IC design.
This paper reviews the different types of circuit topologies that can lead to potentially harmful HiZ and reliable techniques to detect those errors at SoC scale with a very reduced human resource investment.
Webinar – How to Reduce Thousands of False Errors in 15 Minutes
Analyzing electrical errors across an IP or a SoC at top level, can be a painful and long process, often requiring extensive setup time and hundred of hours to distinguish real issues from false positives. To address this challenge, Aniah developed OneCheck, a formal...
