Discover our Product.
Aniah boosts efficiency
and guarantees the
highest design
quality standards
It solves three unmet requirements
of high-quality chip design:
- High-accuracy transistor-level verification at full-chip scale to detect 100% of targeted errors
- Large scale deployment enabling all design engineers to fast debug design errors
- Need to cover 100% of the operating range of circuits : 100% power modes, 100% signal states
About the product
Performance
Built-in errors with optimized flow
Silicon Success
Meet our team
Maxime Rumpler
Baptiste Tournoud
Whitepapers
![ERC: An exhaustive classification of false errors](https://aniah.fr/wp-content/uploads/2024/04/Whitepaper-false-errors.png)
ERC: An exhaustive classification of false errors
All formal verification tools, including Electrical Rules Check (ERC), must reach a trade-off between “false negatives” (i.e., real design errors that are not detected) and “false positives” (or false errors, locations where errors are erroneously reported. This...
![Conditional High Impedance Nets : Early detection in analog and digital topologies](https://aniah.fr/wp-content/uploads/2023/07/whitepaper-HiZ-1.png)
Conditional High Impedance Nets : Early detection in analog and digital topologies
Conditional high-impedance (HiZ) nets errors are among the most serious risks in an IC project because of their capacity to elude Silicon qualification phases and escape into mass-production. They may create a wide range of issues throughout the Validation,...
![Magnify the Traditional Mixed-Signal Eyepatch Verification](https://aniah.fr/wp-content/uploads/2023/04/mixed-signal-aniah.jpg)
Magnify the Traditional Mixed-Signal Eyepatch Verification
Weeks before tapeout, SoC design teams must verify large mixed-signal transistor-level netlists. The standard approach is to verify functionality by running simulations with back-annotated gate-level RTL along with behavioral analog blocks. However, since this...
![ERC: a trade-off between coverage and false positives?](https://aniah.fr/wp-content/uploads/2023/05/02-ERCFalse-Errors-1.jpeg)
ERC: a trade-off between coverage and false positives?
Electrical Rule Checking (ERC) solutions face a double challenge: handle the billions of transistors of a chip and be accurate enough to detect all failure modes. Any solution that doesn’t have a good understanding of the function of each transistor and the electrical...
![Electrical errors in ICs: why they occur and their consequences](https://aniah.fr/wp-content/uploads/2023/05/01-electrical-errors-stakes.jpeg)
Electrical errors in ICs: why they occur and their consequences
The verification of electrical errors at chip-level has always been the missing step in chip design closure – even though a chip is, basically, a very large circuit. The complexity of such an analysis has so far made it impossible. Consequently, considerable effort is...