Analyzing electrical errors across an IP or a SoC at top level, can be a painful and long process, often requiring extensive setup time and hundred of hours to distinguish real issues from false positives.
To address this challenge, Aniah developed OneCheck, a formal analysis tool capable of detecting 100% of electrical errors at the transistor level. With intelligent features, it reduces false positives and groups replicated errors by root cause.
Join our webinar, in collaboration with Semiwiki, for an in-depth look at Aniah OneCheck and its SmartClustering technology, presented by CEO Vincent Bligny. Through a live demo on a 20 million transistor SoC design, you’ll witness OneCheck’s powerful formal analysis and SmartClustering capabilities in action, streamlining setup, processing, and analysis.
Discover in this insightful session for technical experts how modern Electrical Rules Checking solution, with SmartClustering intelligence can transform your verification workflows.
